Wafer testing - Wikipedia
Wafer testing is a step performed during semiconductor device fabrication after back end of line (BEOL) and before IC packaging. Two types of testing are typically done. Very basic wafer parametric tests (WPT) are performed at a few locations on each wafer to ensure the wafer fabrication process has been carried out successfully.
Wafer Test - Tektronix
Tektronix Component Solutions offers a complete suite of wafer test development and testing services. With over 45,000 sq. ft. of Class 10,000 (ISO 7) and Class 1000 (ISO 6) clean room facilities, we can help you ensure your wafers are ready for the most demanding applications.
Wafer Prober: Precise testing of wafer - ACCRETECH (Europe)
Wafer Probers are machines which are required for electrically testing the wafers of individual chips. The Prober therefore undertakes the fully automatic loading and handling of the wafer while ensuring the best positioning accuracy.
Double-Sided Wafer Prober and Tester - SPEA TH2000 | SPEA
TH2000 is a revolutionary automatic wafer prober which combines double-sided wafer probing capability with comprehensive test resources, including electrical test, HV/HI test, warpage and surface verification, and optical inspection.
Wafer Testing - Test Cell Solutions - Teradyne
Teradyne's wafer test solutions allow our testers to dock to a variety of industry leading device probers.
Probing Machines｜Semiconductor Manufacturing Equipment
ACCRETECH Laser dicing machines use lasers instead of blades to dicewafers at high speed in a completely dry process. Polish grinders simultaneously thin wafers while performing damage removal caused by the grinding process, and offer various applications for …
Semiconductor testing | Micron Probing | Wafer Testing
Micron Probing offers Semiconductor testing equipment to assist customer with their Micron level testing needs. Probe Stations from micromanipulator, Analyzers from keysight, optical inspection from ESTEK.
On-wafer testing - Rohde & Schwarz
Discover solutions for on-wafer testing, die testing and RF probing. Explore wafer testing equipment, such as vector network analyzers and probe stations.
Wafer & Probe Card Test - Automatic Test Equipment | Seica Spa
A Probe Card is basically an interface that provides electrical and mechanical contact between the device under test [DUT], which is the semiconductor wafer, and the test system electronics. A Probe Card consists of the following elements: • The Multilayer Organic substrate (MLO) • The PCB The wafer test system is composed by different parts:
Aehr Announces Initial FOX-XP Multi-wafer Test and Burn-in …
4 days ago · FREMONT, CA / ACCESSWIRE / January 7, 2025 / Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced it has received an initial production order from a top tier automotive semiconductor supplier for a FOX-XP™ wafer level test and burn-in system with fully integrated FOX WaferPak™ Aligner for production test of their gallium nitride ...