Electrical testing involves the simple connection of conductors, whether those are wafer probes or contacts on a final tester. For wafer testing, fixed probe cards are created for each die. The probe ...

We recently published a list of 10 AI Stocks on Wall Street’s Radar. In this article, we are going to take a look at where ...

Older or simpler designs may just have a simple pad ring surrounding the core of the chip, with metallised contact areas for each connection ... product requires wafer level testing, then more ...

South Korean testing equipment provider Nextin is reportedly in discussions to supply testing equipment to Japanese NAND ...