Electrical testing involves the simple connection of conductors, whether those are wafer probes or contacts on a final tester. For wafer testing, fixed probe cards are created for each die. The probe ...

Older or simpler designs may just have a simple pad ring surrounding the core of the chip, with metallised contact areas for each connection ... product requires wafer level testing, then more ...

and seller of test and burn-in products for semiconductor devices in the wafer level, singulated die, and package part forms globally. The company’s high-power package part burn-in test ...

By leveraging our FOX-XP system and our proprietary WaferPak full wafer Contactors, customers can easily test wafers of varying sizes from 6 to 12 inches by simply purchasing new WaferPaks ...