Electrical testing involves the simple connection of conductors, whether those are wafer probes or contacts on a final tester. For wafer testing, fixed probe cards are created for each die. The probe ...

By leveraging our FOX-XP system and our proprietary WaferPak full wafer Contactors, customers can easily test wafers of varying sizes from 6 to 12 inches by simply purchasing new WaferPaks ...

Older or simpler designs may just have a simple pad ring surrounding the core of the chip, with metallised contact areas for each connection ... product requires wafer level testing, then more ...