As design size and complexity increase, so too does the cost of test. Both the design community and the test industry are looking at various approaches to lower the cost of manufacturing test. This ...

Design for test (DFT) has been around since the 1960s. The technology was developed to reduce the cost of creating a successful test for an IC. Scan design, fault models, and automatic test pattern ...

In recent years, boundary scan has transformed itself. JTAG started more than a decade ago as a simple structural interconnect test technology. It now is a foundational embedded infrastructure capable ...

Some new design-for-test (DFT) technologies are difficult, expensive, or risky to implement but offer significant benefits. Other technologies are easy to implement but offer minor improvements. The ...

Over the last few years, design-for-test (DFT) chip-testing techniques such as internal scan (ISCAN), automatic test-pattern generation (ATPG), built-in self-test (BIST), and boundary scan (BSCAN) ...

For decades, process and design scaling has triggered the adoption of transformative test solutions. About twenty years ago, when at-speed test became a de-facto requirement, on-chip compression ...

Meridian DFT (Design For Test) from Real Intent delivers multimode design-for-test (DFT) static sign-off to ensure maximum scan coverage and silicon s ...